Research on Quality and Reliability Technology of GaN Electronic Devices for Engineering Applications

2020-09-21 学术讲座 浏览量：2347

Academic Frontier Lecture No. 058

TIME: Tue. 10:30 pm, Sep.22th 2020

VENUE: Room 427, Building3, Nanshan i Park Chongwen(崇文智园3号楼427会议室)   

SPEAKER: Zhiyuan HE, Senior Engineer

TITLE: Research on Quality and Reliability Technology of GaN Electronic Devices for Engineering Applications

LANGUAGE: Chinese